iStereo-6745 Stereo Microscope

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https://mikrosize.com/product/istereo-6745-stereo-microscope/

Product Features：

• Premium optical components coated with special coatings deliver high-quality optical images.
• It produces erect images with flat focal planes and excellent contrast across a wide field of view, featuring notably brighter, sharper imagery at peripheral fields.
• Equipped with a 0.67X–5X continuous zoom objective lens (6.7:1 zoom ratio). Paired with WF10X eyepieces, the standard magnification ranges from 6.7X to 45X. Optional auxiliary objectives extend the magnification range to 2.01X–270X.
• The standard effective working distance is 105 mm. Fitted with optional auxiliary objectives, the working distance can be extended to 26–287 mm (1.02–30 inch), providing ample operating space.
• The observation head tilts at 45° with binocular diopter adjustment, allowing users with varying eyesight to capture crisp, satisfying viewing images.
• Ergonomic structural design with optimal eye-point height avoids fatigue during long-hour observation.
• Zoom handwheels are horizontally (axially) mounted on both sides for convenient, comfortable operation and outstanding zoom repeatability.

Product Applications：

• Ideal for microstructural observation and defect inspection of electronic components, precision mechanical parts, PCBs, new materials and other workpieces.
• Meets requirements for on-site real-time quality control and high-precision laboratory analysis, covering incoming material inspection, process monitoring, finished product acceptance and other workflow stages.
• Supports precise dimensional measurement and data archiving, suited for multiple scenarios including research institutes, factory QC departments and university laboratories.
• Allows comparative analysis between real-time captured images and stored snapshots to streamline consistency verification and anomaly troubleshooting in mass production.
• Compatible with specimens made of metals, plastics, electronic components and other materials, and satisfies inspection demands for both planar and three-dimensional structures.